作者:高紫俊;许晶; 时间:2011-01-01 点击数:
高紫俊;许晶;
1:哈尔滨理工大学荣成学院
2:大庆电力集团油田热电厂
摘要(Abstract):
为有效降低确定性内建自测试的存储要求,提出一种结合扭环计数器TRC和Golomb编码的二维测试数据压缩的确定性内建自测试方案.首先利用基于扭环计数器TRC的测试集嵌入技术对测试集进行垂直压缩,从而减少确定性测试向量的个数;然后利用Golomb编码对垂直压缩所得TRC种子集再进行水平压缩,降低确定性测试向量的位数.基于ISCAS89标准电路的实验结果表明,相对于现有算法,采用本方案所实现的测试电路,存储位数平均减少30%,并且测试控制逻辑电路简单,可重用性好.
关键词(KeyWords):内建自测试(BIST);测试数据压缩;Golomb编码;扭环计数器(TRC)
Abstract:
Keywords:
基金项目(Foundation):
作者(Author):高紫俊;许晶;
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